"Contributions of SRAM, FF and combinational circuit to chip-level ..."

Liao Wang et al. (2017)

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DOI: 10.1109/NEWCAS.2017.8010098

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Liao Wang, Soichi Hirokawa, Ryo Harada, Masanori Hashimoto:
Contributions of SRAM, FF and combinational circuit to chip-level neutron-induced soft error rate: - Bulk vs. FD-SOI at 0.5 and 1.0V -. NEWCAS 2017: 33-36

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