"META: A Layout Based Tool to Estimate the Vulnerability of Digital ..."

Vivek Bansal, Otmane Aït Mohamed, Sowmith Nethula (2022)

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DOI: 10.1109/NEWCAS52662.2022.9842148

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-11

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Vivek Bansal, Otmane Aït Mohamed, Sowmith Nethula:
META: A Layout Based Tool to Estimate the Vulnerability of Digital Circuits to Multiple Event Transient. NEWCAS 2022: 450-454

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