"Design of high-yield defect-tolerant self-assembled nanoscale memories."

Girish Venkatasubramanian, P. Oscar Boykin, Renato J. O. Figueiredo (2007)

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DOI: 10.1109/NANOARCH.2007.4400861

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Girish Venkatasubramanian, P. Oscar Boykin, Renato J. O. Figueiredo:
Design of high-yield defect-tolerant self-assembled nanoscale memories. NANOARCH 2007: 77-84

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