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"Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM."

Mingyue Liu et al. (2019)

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DOI: 10.1109/NANOARCH47378.2019.181292

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/nanoarch/LiuCHXYN19
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  - https://dblp.org/rec/conf/nanoarch/LiuCHXYN19
Mingyue Liu, Hao Cai, Menglin Han, Lei Xie, Jun Yang, Lirida A. B. Naviner:
Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM. NANOARCH 2019: 1-6

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