"Statistical reliability analysis of NBTI impact on FinFET SRAMs and ..."

Yao Wang, Sorin Dan Cotofana, Liang Fang (2012)

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DOI: 10.1145/2765491.2765512

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-11

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  - https://dblp.org/rec/conf/nanoarch/0002CF12
Yao Wang, Sorin Dan Cotofana, Liang Fang:
Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices. NANOARCH 2012: 109-115

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