"Automated wafer-level measurement of LDMOS reverse recovery parameters."

Jose A. Rodriguez Latorre, Manuel A. Jimenez, Rogelio Palomera (2012)

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DOI: 10.1109/MWSCAS.2012.6292209

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-26

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Jose A. Rodriguez Latorre, Manuel A. Jimenez, Rogelio Palomera:
Automated wafer-level measurement of LDMOS reverse recovery parameters. MWSCAS 2012: 1072-1075

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