"A SVM Based Method to Detect Color Shift Defects in IC Packages."

R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari (2007)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2020-03-12

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  - electronic edition @ u-tokyo.ac.jp (open access)
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  dblp key:
  - conf/mva/RatnayakeHA07
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  persistent URL:
  - https://dblp.org/rec/conf/mva/RatnayakeHA07
R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari:
A SVM Based Method to Detect Color Shift Defects in IC Packages. MVA 2007: 138-141

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