"An Enhanced Strategy for Functional Stress Pattern Generation for ..."

Mauricio de Carvalho et al. (2010)

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DOI: 10.1109/MTV.2010.14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/mtv/CarvalhoBSR10
Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda:
An Enhanced Strategy for Functional Stress Pattern Generation for System-on-Chip Reliability Characterization. MTV 2010: 29-34

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