"Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM."

Michael Redeker et al. (2002)

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DOI: 10.1109/MTDT.2002.1029772

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott, Yunan Xiang, Sue Ann Ung:
Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM. MTDT 2002: 117-122

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