"Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes."

Zaid Al-Ars, Ad J. van de Goor (2003)

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DOI: 10.1109/MTDT.2003.1222357

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zaid Al-Ars, Ad J. van de Goor:
Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes. MTDT 2003: 27-32

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