"An Integrated Memory Self Test and EDA Solution."

R. Dean Adams et al. (2004)

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DOI: 10.1109/MTDT.2004.5

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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R. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald:
An Integrated Memory Self Test and EDA Solution. MTDT 2004: 92-95

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