"A MIP model for IC final testing order selection problem."

Chun-Ying Huang, Amy Hsin-I Lee, Tzu-Yun Chang (2008)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2009-02-10

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Chun-Ying Huang, Amy Hsin-I Lee, Tzu-Yun Chang:
A MIP model for IC final testing order selection problem. MSV 2008: 238-241

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