"Reliability Mechanisms for Very Large Storage Systems."

Qin Xin et al. (2003)

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DOI: 10.1109/MASS.2003.1194851

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Qin Xin, Ethan L. Miller, Thomas J. E. Schwarz, Darrell D. E. Long, Scott A. Brandt, Witold Litwin:
Reliability Mechanisms for Very Large Storage Systems. IEEE Symposium on Mass Storage Systems 2003: 146-156

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