"Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental ..."

Vassilios D. Vassios et al. (2024)

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DOI: 10.1109/MOCAST61810.2024.10615504

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-13

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Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis G. Intzes, Dimitrios K. Papakostas:
Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation. MOCAST 2024: 1-4

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