"Exposing image forgery with blind noise estimation."

Xunyu Pan, Xing Zhang, Siwei Lyu (2011)

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DOI: 10.1145/2037252.2037256

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-20

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Xunyu Pan, Xing Zhang, Siwei Lyu:
Exposing image forgery with blind noise estimation. MM&Sec 2011: 15-20

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