"Modeling and Simulation of Charge Trapping in 1/f Noise, RTN and BTI: from ..."

Gilson I. Wirth (2021)

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DOI: 10.23919/MIXDES52406.2021.9497643

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Gilson I. Wirth:
Modeling and Simulation of Charge Trapping in 1/f Noise, RTN and BTI: from Devices to Circuits. MIXDES 2021: 14-19

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