"Degradation and temperature analysis of voltage-controlled ring ..."

Konstantin Tscherkaschin et al. (2016)

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DOI: 10.1109/MIXDES.2016.7529764

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process. MIXDES 2016: 353-358

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