"Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor ..."

Krzysztof Piskorski et al. (2018)

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DOI: 10.23919/MIXDES.2018.8436596

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Krzysztof Piskorski, Henryk M. Przewlocki, Vikram Passi, Jasper Ruhkopf, Max Christian Lemme:
Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures. MIXDES 2018: 319-323

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