"Joint Characterization of MM-Wave and CM-Wave Device-to-Device Fading ..."

Seun Sangodoyin et al. (2018)

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DOI: 10.1109/MILCOM.2018.8599827

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-15

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Seun Sangodoyin, Usman T. Virk, Daoud Burghal, Katsuyuki Haneda, Andreas F. Molisch:
Joint Characterization of MM-Wave and CM-Wave Device-to-Device Fading Channels. MILCOM 2018: 194-200

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