"The effect of beam hardening on resolution in x-ray microtomography."

Elke Van de Casteele et al. (2004)

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DOI: 10.1117/12.535263

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-27

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Elke Van de Casteele, Dirk Van Dyck, Jan Sijbers, Erik Raman:
The effect of beam hardening on resolution in x-ray microtomography. Image Processing 2004

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