"An Automated 3D Algorithm for Neo-cortical Thickness Measurement."

Siddharth Srivastava et al. (2003)

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DOI: 10.1007/978-3-540-39903-2_60

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-19

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Siddharth Srivastava, Frederik Maes, Dirk Vandermeulen, Patrick Dupont, Wim Van Paesschen, Paul Suetens:
An Automated 3D Algorithm for Neo-cortical Thickness Measurement. MICCAI (2) 2003: 488-495

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