"IEEE International Conference on Metrology for Extended Reality, ..."

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DOI: 10.1109/METROXRAINE54828.2022

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type: Editorship

metadata version: 2023-09-11

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IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2022, Rome, Italy, October 26-28, 2022. IEEE 2022, ISBN 978-1-6654-8574-6 [contents]

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