"Measuring and Improving Design Patterns Testability."

Benoit Baudry et al. (2003)

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DOI: 10.1109/METRIC.2003.1232455

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel:
Measuring and Improving Design Patterns Testability. IEEE METRICS 2003: 50-

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