"Improving Memory Reliability by Bounding DRAM Faults: DDR5 improved ..."

Kjersten Criss et al. (2020)

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DOI: 10.1145/3422575.3422803

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Kjersten Criss, Kuljit Bains, Rajat Agarwal, Tanj Bennett, Terry Grunzke, Jangryul Keith Kim, Hoeju Chung, Munseon Jang:
Improving Memory Reliability by Bounding DRAM Faults: DDR5 improved reliability features. MEMSYS 2020: 317-322

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