"Measuring the SoC development process quality with Fault-slip-Through ..."

Antti Rautakoura, Erno Salminen, Timo Hämäläinen (2024)

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DOI: 10.1109/MECO62516.2024.10577831

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-24

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Antti Rautakoura, Erno Salminen, Timo Hämäläinen:
Measuring the SoC development process quality with Fault-slip-Through methodology. MECO 2024: 1-8

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