"Scalability of Post-Silicon Test Generation for Multi-core RISC-V SOC ..."

Sih Pin Tan, Yung It Ho (2022)

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DOI: 10.1109/MCSOC57363.2022.00012

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-26

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Sih Pin Tan, Yung It Ho:
Scalability of Post-Silicon Test Generation for Multi-core RISC-V SOC Validation. MCSoC 2022: 14-17

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