"Effiziente Simulation von Gateoxiddefekten auf Gatterebene mit ..."

Hagen Sämrow et al. (2012)

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type: Conference or Workshop Paper

metadata version: 2012-06-27

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  dblp key:
  - conf/mbmv/SamrowCGST12
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  persistent URL:
  - https://dblp.org/rec/conf/mbmv/SamrowCGST12
Hagen Sämrow, Claas Cornelius, Philipp Gorski, Jakob Salzmann, Dirk Timmermann:
Effiziente Simulation von Gateoxiddefekten auf Gatterebene mit Transistorlevel-Genauigkeit. MBMV 2012: 157-168

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