"Test Generation for Large-Scale Combinational Circuits by Using Prolog."

Yoshihiro Tohma, Kenji Goto (1987)

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DOI: 10.1007/3-540-19426-6_19

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Yoshihiro Tohma, Kenji Goto:
Test Generation for Large-Scale Combinational Circuits by Using Prolog. LP 1987: 298-312

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