"Parametric DC and noise measurements in a unified test & ..."

Jose A. Rodriguez et al. (2012)

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DOI: 10.1109/LATW.2012.6261239

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/latw/RodriguezJMHMP12
Jose A. Rodriguez, Manuel Jiménez, William Morales, Fan-Chi Hou, Lucianne Millan, Rogelio Palomera:
Parametric DC and noise measurements in a unified test & characterization software tool framework. LATW 2012: 1-6

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