"Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault ..."

Marcial Jesús Rodríguez-Irago et al. (2006)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2023-07-27

- no documents available
- export record
  dblp key:
  - conf/latw/Rodriguez-Irago06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/latw/Rodriguez-Irago06
Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault Detection in Digital Systems. LATW 2006: 103-107

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.