"IC immunity modeling process validation using on-chip measurements."

Sonia Ben Dhia et al. (2011)

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DOI: 10.1109/LATW.2011.5985912

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-27

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Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC immunity modeling process validation using on-chip measurements. LATW 2011: 1-6

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