"Defect Oriented Testing of an ECL/CMOS Level Converter Circuit."

Min-Hsing P. Chen, André Ivanov, Sassan Tabatabaei (2000)

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type: Conference or Workshop Paper

metadata version: 2023-07-25

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Min-Hsing P. Chen, André Ivanov, Sassan Tabatabaei:
Defect Oriented Testing of an ECL/CMOS Level Converter Circuit. LATW 2000: 42-46

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