"Exploring trade-offs in multi-site wafer testing."

Paolo Bernardi, Lorenzo Cardone, Tommaso Foscale (2024)

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DOI: 10.1109/LATS62223.2024.10534596

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-05

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Paolo Bernardi, Lorenzo Cardone, Tommaso Foscale:
Exploring trade-offs in multi-site wafer testing. LATS 2024: 1-4

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