"A Maximum Likelihood Method for Detecting Bad Samples from Illumina ..."

Ha Anh Tuan Nguyen, Le Sy Vinh, Si Quang Le (2012)

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DOI: 10.1109/KSE.2012.24

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ha Anh Tuan Nguyen, Le Sy Vinh, Si Quang Le:
A Maximum Likelihood Method for Detecting Bad Samples from Illumina BeadChips Data. KSE 2012: 26-33

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