"Defect Classification of Electronic Board Using Dense SIFT and CNN."

Yuji Iwahori et al. (2018)

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DOI: 10.1016/J.PROCS.2018.08.110

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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Yuji Iwahori, Yohei Takada, Tokiko Shiina, Yoshinori Adachi, Manas Kamal Bhuyan, Boonserm Kijsirikul:
Defect Classification of Electronic Board Using Dense SIFT and CNN. KES 2018: 1673-1682

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