"Metric Learning from Probabilistic Labels."

Mengdi Huai et al. (2018)

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DOI: 10.1145/3219819.3219976

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-23

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Mengdi Huai, Chenglin Miao, Yaliang Li, Qiuling Suo, Lu Su, Aidong Zhang:
Metric Learning from Probabilistic Labels. KDD 2018: 1541-1550

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