"IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT ..."

Peiyu Liu et al. (2021)

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DOI: 10.1109/ASE51524.2021.9678785

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Peiyu Liu, Shouling Ji, Xuhong Zhang, Qinming Dai, Kangjie Lu, Lirong Fu, Wenzhi Chen, Peng Cheng, Wenhai Wang, Raheem Beyah:
IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware. ASE 2021: 805-816

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