"Analysis of an Artifact Oriented Test Process Model and of Testing Aspects ..."

Paulo Marcos Siqueira Bueno et al. (2008)

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type: Conference or Workshop Paper

metadata version: 2024-01-08

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Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Clênio F. Salviano, Mário Jino:
Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504. JIISIC 2008: 147-154

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