"Deep Statistical Analysis of OCR Errors for Effective Post-OCR Processing."

Thi-Tuyet-Hai Nguyen et al. (2019)

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DOI: 10.1109/JCDL.2019.00015

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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  dblp key:
  - conf/jcdl/NguyenJCND19
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  - https://dblp.org/rec/conf/jcdl/NguyenJCND19
Thi-Tuyet-Hai Nguyen, Adam Jatowt, Mickaël Coustaty, Nhu-Van Nguyen, Antoine Doucet:
Deep Statistical Analysis of OCR Errors for Effective Post-OCR Processing. JCDL 2019: 29-38

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