"Transistor Based Source Degeneration: A Calibration-less Open-Loop ..."

Kyle van Oosterhout et al. (2023)

> Home

Details and statistics

DOI: 10.1109/IWASI58316.2023.10164482

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iwasi/OosterhoutTFC23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iwasi/OosterhoutTFC23
Kyle van Oosterhout, Martijn Timmermans, Marco Fattori, Eugenio Cantatore:
Transistor Based Source Degeneration: A Calibration-less Open-Loop Linearization Technique. IWASI 2023: 160-165

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.