"Faster-than-at-speed test for increased test quality and in-field reliability."

Tomokazu Yoneda et al. (2011)

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DOI: 10.1109/TEST.2011.6139131

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Tomokazu Yoneda, Keigo Hori, Michiko Inoue, Hideo Fujiwara:
Faster-than-at-speed test for increased test quality and in-field reliability. ITC 2011: 1-9

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