"Robust Design-for-Testability Scheme for Conventional and Unique Defects ..."

Hanzhi Xun et al. (2024)

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DOI: 10.1109/ITC51657.2024.00059

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. ITC 2024: 374-383

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