"Non-scan design for testability for synchronous sequential circuits based ..."

Dong Xiang, Yi Xu, Hideo Fujiwara (2000)

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DOI: 10.1109/TEST.2000.894245

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dong Xiang, Yi Xu, Hideo Fujiwara:
Non-scan design for testability for synchronous sequential circuits based on conflict analysis. ITC 2000: 520-529

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