"A Unified Interface for Scan Test Generation Based on STIL."

Peter Wohl, John A. Waicukauski (1997)

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DOI: 10.1109/TEST.1997.639718

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Peter Wohl, John A. Waicukauski:
A Unified Interface for Scan Test Generation Based on STIL. ITC 1997: 1011-1019

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