"Test Generation for Ultra-Large Circuits Using ATPG Constraints and ..."

Peter Wohl, John A. Waicukauski (1996)

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DOI: 10.1109/TEST.1996.556938

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Peter Wohl, John A. Waicukauski:
Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates. ITC 1996: 13-20

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