"New Front-End and Line Justification Algorithm for Automatic Test Generation."

Ruey-Sing Wei, Alberto L. Sangiovanni-Vincentelli (1986)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-10-22

- no documents available
- export record
  dblp key:
  - conf/itc/WeiS86
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/WeiS86
Ruey-Sing Wei, Alberto L. Sangiovanni-Vincentelli:
New Front-End and Line Justification Algorithm for Automatic Test Generation. ITC 1986: 121-128

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.