"Implementation of Model-Based Testing for Medium to High-Resolution ..."

Carsten Wegener, Michael Peter Kennedy (2002)

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DOI: 10.1109/TEST.2002.1041839

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Carsten Wegener, Michael Peter Kennedy:
Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. ITC 2002: 851-860

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