"ICTEST : A Unified System for Functional Testing and Simulation of Digital ..."

I. M. Watson et al. (1982)

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type: Conference or Workshop Paper

metadata version: 2006-06-27

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I. M. Watson, John A. Newkirk, Robert G. Mathews, D. B. Boyle:
ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs. ITC 1982: 499-502

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