"Defects, Fault Modeling, and Test Development Framework for FeFETs."

Changhao Wang et al. (2024)

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DOI: 10.1109/ITC51657.2024.00026

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui:
Defects, Fault Modeling, and Test Development Framework for FeFETs. ITC 2024: 91-95

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