"Tackling test trade-offs from design, manufacturing to market using ..."

Erik H. Volkerink et al. (2001)

> Home

Details and statistics

DOI: 10.1109/TEST.2001.966736

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/VolkerinkKKRK01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/VolkerinkKKRK01
Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff:
Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC 2001: 1098-1107

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.